Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunc
Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence | Division of Chemical Physics Skip to main content To Lund University Security and internal information (in Canvas, log-in required) Listen Search Search Division of Chemical Physics Department of Chemistry | Faculty of Science Listen Search Education Research Publ
https://www.chemphys.lu.se/ivan-scheblykin/publication/85f69cba-2dee-4eda-af4e-482da4e8064a - 2025-12-08
