Diffusion length measurements in axial and radial heterostructured nanowires using cathodoluminescence
We have measured the ambipolar diffusion lengths in nanowires with GaAs and AlGaAs core material using cathodoluminescence imaging. This was done by combining III-V semiconductor materials with different bandgaps in single nanowires. We show that it is possible to record intensity profiles of the emission from segments of lower bandgap material positioned along the nanowire length and in this way
