Dual-phase x-ray grating interferometry (DP-XGI) is a recently developed imaging technique that can retrieve structural information in the sub-micro scale over areas in the millimeter range. This is performed by use of the scattering signal, which is sensitive to structures that lie below the intrinsic spatial resolution of the imaging system. A quantitative understanding of the microstructure is

Small-angle x-ray scattering tensor tomography provides three-dimensional information on the unresolved material anisotropic microarchitecture, which can be hundreds of times smaller than an image pixel. We develop a direct filtered back-projection method based on algebraic filters that enables rapid tensor-tomographic reconstructions and is a few orders of magnitude faster compared to established

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X-ray dark-field and phase contrast imaging using grating interferometry (GI) have demonstrated great potential for medical and industrial applications. GI relies on the fabrication of high-quality absorption gratings, which has revealed to be quite challenging. This paper proposes an interferometer for dark-field and differential phase contrast imaging using a single phase-shifting element. This

Fiber-reinforced composites deliver lightweight but strong structures that are crucial in applications ranging from aerospace to the automotive industry. The advent of freeform injection molding has made the manufacturing of complex fiber-reinforced composites with full design freedom possible. Prediction of the mechanical properties, dictated by the local microfiber orientation, is essential for

X-ray computed micro-tomography typically involves a trade-off between sample size and resolution, complicating the study at a micrometer scale of representative volumes of materials with broad feature size distributions (e.g. natural stones). X-ray dark-field tomography exploits scattering to probe sub-resolution features, promising to overcome this trade-off. In this work, we present a quantific

Imaging the (sub)micron scale over large areas with high temporal resolution becomes increasingly necessary for the development and investigation of novel materials under realistic operation conditions. Small angle x-ray scattering imaging methods provide micro- and nanoscale structural information of materials. A fundamental shortcoming of such methods is the long acquisition time required to inv

High aspect ratio nanostructuring requires high precision pattern transfer with highly directional etching. In this work, we demonstrate the fabrication of structures with ultra-high aspect ratios (up to 10 000 : 1) in the nanoscale regime (down to 10 nm) by platinum assisted chemical etching of silicon in the gas phase. The etching gas is created by a vapour of water diluted hydrofluoric acid and

We demonstrated the use of a neutron grating interferometer setup (nGI) with a significantly improved contrast-to-noise ratio of the operando dark-field (DF) contrast visualization of water in gas diffusion media (GDM). The nGI parameters were optimized in such a way that we could perform DF imaging of a fully operational fuel cell including two GDM layers (anode and cathode side). The DF contrast

Three dimensional (3D) information of the microstructure organization of various relevant materials in industry and nature is fundamental to master the understanding of their macroscopic properties. X-ray scattering tensor tomography provides 3D directional information on unresolved microstructures in large volumes, facilitating the investigation of the microstructural organization in statisticall

Within neutron imaging, different methods have been developed with the aim to go beyond the conventional contrast modalities, such as grating interferometry. Existing grating interferometers are sensitive to scattering in a single direction only, and thus investigations of anisotropic scattering structures imply the need for a circular scan of either the sample or the gratings. Here we propose an

Insights into the micro- and nano-architecture of materials is crucial for understanding and predicting their macroscopic behaviour. In particular, for emerging applications such as meta-materials, the micrometer scale becomes highly relevant. The micro-architecture of such materials can be tailored to exhibit specific mechanical, optical or electromagnetic behaviours. Consequently, quality contro

High quality gratings are among the key elements for successful imaging with X-ray grating interferometry. Grating fabrication, specifically of absorption gratings, with high aspect ratio and large area, is a great challenge from a microfabrication point of view. In this paper the fabrication of absorption gratings by seedless electroplating of gold in high aspect ratio silicon moulds that are fab

X-ray grating interferometry is an excellent technique for X-ray phase contrast imaging and X-ray wavefront sensing with applications in materials science, biology and medical diagnosis. Among other requirements, the method depends on the availability of highly X-ray absorbing metallic gratings. Here, we report on the fabrication and characterization of high aspect ratio iridium gratings with a pe

Small angle X-ray scattering has been proven to be a valuable method for accessing structural information below the spatial resolution limit implied by direct imaging. Here, we theoretically derive the relation that links the subpixel differential phase signal provided by the sample to the moments of scattering distributions accessible by refraction sensitive X-ray imaging techniques. As an import

Despite the fact that the resolution of conventional contact/proximity lithography can reach feature sizes down to ∼0.5-0.6 micrometers, the accurate control of the linewidth and uniformity becomes already very challenging for gratings with periods in the range of 1-2 μm. This is particularly relevant for the exposure of large areas and wafers thinner than 300 μm. If the wafer or mask surface is n